发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device in which a MOS structure is used as a diode, with a low leakage current to a semiconductor substrate. <P>SOLUTION: A semiconductor device comprises a field-effect transistor and a resistance element 20. The resistance element is connected between a gate electrode 19 of the field-effect transistor and a connection point 23 of a back gate electrode 24 and a first source/drain region 16 of the field-effect transistor. A voltage is applied between a second source/drain region 15 and the gate electrode 19. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012015354(A) 申请公布日期 2012.01.19
申请号 JP20100151007 申请日期 2010.07.01
申请人 TOSHIBA CORP 发明人 NAKAMURA YUKI;IKIMURA TAKEHITO
分类号 H01L27/06;H01L21/8234;H01L29/78;H01L29/786;H01L29/861 主分类号 H01L27/06
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