发明名称 TEMPERATURE-PROGRAMMED DESORPTION ANALYSIS METHOD AND TEMPERATURE-PROGRAMMED DESORPTION ANALYZER
摘要 <P>PROBLEM TO BE SOLVED: To easily provide a value of activation energy of a component in a solid sample. <P>SOLUTION: A temperature-programmed desorption analyzer includes an infrared ray lamp 203 to be temperature increasing means for increasing the temperature of the solid sample 202, and a temperature controller 207 for controlling a current value to be made to flow to the infrared ray lamp 203 and controlling the temperature of the solid sample 202. The temperature of the solid sample 202 whose temperature is being increased is a first function for which the time is a variable, a second function for which a certain positive number is a cardinal number and the inverse number of the first function is an exponential can be integrated by the time, and the first function is given so that the primitive function of the second function becomes an elementary function. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011247713(A) 申请公布日期 2011.12.08
申请号 JP20100120261 申请日期 2010.05.26
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 AZUMA YASUHIRO;FUJIMOTO NORIHIRO
分类号 G01N25/14;G01N25/36 主分类号 G01N25/14
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