发明名称 Semiconductor device and method of fabricating the same
摘要 The invention relates to a semiconductor device and a method of fabricating the same, wherein a storage node contact hole is made large to solve any problem caused during etching a storage node contact hole with a small CD, a landing plug is formed to lower plug resistance, and the SAC process is eliminated at the time of the bit line formation. A method of fabricating a semiconductor device according to the invention comprises: forming a device isolation film for defining a multiplicity of active regions in a semiconductor substrate; forming a multiplicity of buried word lines in the semiconductor substrate; forming a storage node contact hole for exposing a storage node contact region of two adjoining active regions; filling the storage node contact hole with a storage node contact plug material; forming a bit-line groove for exposing a bit-line contact region of the active region and splitting the storage node contact plug material into two; and burying the bit line into the bit-line groove.
申请公布号 US8048737(B2) 申请公布日期 2011.11.01
申请号 US20090648710 申请日期 2009.12.29
申请人 HYNIX SEMICONDUCTOR, INC. 发明人 KIM DO HYUNG;CHO YOUNG MAN
分类号 H01L27/108 主分类号 H01L27/108
代理机构 代理人
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