发明名称 ASSEMBLY INSPECTION APPARATUS AND ASSEMBLY PROCESSING APPARATUS USING THE SAME
摘要 PROBLEM TO BE SOLVED: To easily and accurately inspect an attachment state of an assembled attachment part when putting the attachment part into an attached part.SOLUTION: An assembly inspection apparatus includes: a recognition indicator 12 having four or more unit pattern marks 13 which are provided, at the predetermined positional relation, in a part of an attachment part 2 to be put into the attached part 1 and which are formed in such a way that a density pattern Pc sequentially changes from a center position C to a periphery; an imaging tool 5 that is disposed opposite the attachment part 2 put into the attached part 1 and that images the recognition indicator 12; a layout information recognition block 6 that recognizes layout information about a position and a posture of the attachment part 2 put into the attached part 1 by using at least imaging information of the recognition indicator 12 imaged by the imaging tool 5; and an assembly inspection block 7 that inspects whether or not a superior assembly state is achieved based on the layout information recognized by the layout information recognition block 6. An assembly processing apparatus using the assembly inspection apparatus is also provided.
申请公布号 JP2011206878(A) 申请公布日期 2011.10.20
申请号 JP20100076211 申请日期 2010.03.29
申请人 FUJI XEROX CO LTD 发明人 KOIKE NAOKI;WAKABAYASHI KIMIHIRO
分类号 B23P19/00;B25J19/04 主分类号 B23P19/00
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