| 发明名称 |
Cantilever probe structure for a probe card assembly |
| 摘要 |
A probe for a probe card assembly includes a beam and a fulcrum element. The fulcrum element is positioned between a base end portion of the beam and a tip end portion of the beam and is adapted for contact with the beam such that the beam is cantilevered by the fulcrum.
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| 申请公布号 |
US8004299(B2) |
申请公布日期 |
2011.08.23 |
| 申请号 |
US201113038140 |
申请日期 |
2011.03.01 |
| 申请人 |
SV PROBE PTE. LTD. |
发明人 |
WILLIAMS SCOTT R.;LAURENT EDWARD;BEATSON DAVID T.;TUNABOYLU BAHADIR;MALANTONIO EDWARD L. |
| 分类号 |
G01R1/067;G01R31/00 |
主分类号 |
G01R1/067 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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