发明名称 |
ENHANCEMENT NITRIDE BASED SEMICONDUCTOR DEVICE EMPLOYING FLOATING GATE STRUCTURE |
摘要 |
<p>PURPOSE: An enhancement nitride based semiconductor device using a floating gate structure is provided to use a floating gate structure, thereby moving the threshold voltage of the device toward a positive direction without influencing a secondary electron gas layer. CONSTITUTION: A source electrode(35) is formed on one side of a nitride based semiconductor layer(301). A drain electrode(36) is formed on the other side of the nitride based semiconductor layer. A first insulation layer(37-1) is formed between the source electrode and the drain electrode. A floating gate(38-1) is separated from the source electrode and the drain electrode. A control gate(38-2) is formed on the top or the side of the second insulation layer.</p> |
申请公布号 |
KR20110058332(A) |
申请公布日期 |
2011.06.01 |
申请号 |
KR20090115082 |
申请日期 |
2009.11.26 |
申请人 |
FAIRCHILD KOREA SEMICONDUCTOR LTD. |
发明人 |
HAN, MIN KOO;CHOI, YOUNG HWAN;LIM, JI YONG |
分类号 |
H01L21/8247;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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