发明名称 ENHANCEMENT NITRIDE BASED SEMICONDUCTOR DEVICE EMPLOYING FLOATING GATE STRUCTURE
摘要 <p>PURPOSE: An enhancement nitride based semiconductor device using a floating gate structure is provided to use a floating gate structure, thereby moving the threshold voltage of the device toward a positive direction without influencing a secondary electron gas layer. CONSTITUTION: A source electrode(35) is formed on one side of a nitride based semiconductor layer(301). A drain electrode(36) is formed on the other side of the nitride based semiconductor layer. A first insulation layer(37-1) is formed between the source electrode and the drain electrode. A floating gate(38-1) is separated from the source electrode and the drain electrode. A control gate(38-2) is formed on the top or the side of the second insulation layer.</p>
申请公布号 KR20110058332(A) 申请公布日期 2011.06.01
申请号 KR20090115082 申请日期 2009.11.26
申请人 FAIRCHILD KOREA SEMICONDUCTOR LTD. 发明人 HAN, MIN KOO;CHOI, YOUNG HWAN;LIM, JI YONG
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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