发明名称 VISUAL EXAMINATION METHOD AND VISUAL EXAMINATION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a visual examination method which enables the precise and certain detection of a flaw even in a case that the flaw is present in a dark part, and a visual examination device. SOLUTION: The visual examination method includes the step of imaging an inspection target 22 to obtain the image P1 of the inspection target 22, the step of dividing a processing region A2 into first to k-th sections and calculating the k-th average brightness value MBk being the average value of the brightness values of the respective pixels contained in the k-th section, the step of selecting the largest value among the average brightness values of the first to k-th sections as the maximum value MBmax, the step of respectively substituting the value obtained according the formula (1): Ik(x, y)×MBmax/MBk for the brightness values of the respective pixels contained in the k-th section to form a substitution image Pr, the step of forming a standard image P2 becoming a standard with respect to the substitution image Pr, and the step of performing the shading correction of the taken image P1 using the standard image P2. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010249522(A) 申请公布日期 2010.11.04
申请号 JP20090095962 申请日期 2009.04.10
申请人 TDK CORP 发明人 MINAGAWA KEIJI
分类号 G01N21/88;G06T1/00 主分类号 G01N21/88
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