发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A manufacturing method of a semiconductor device is provided to prevent the generation of a SAC failure by preventing the generation of a bridge between a gate and a LPC plug. CONSTITUTION: A device separating film, which limits an active area(102), is formed. A screen oxidation film(120) is formed on the active area of a semiconductor substrate. The device separating film(110) part is etched and a first recess pattern is formed on the active area. A second recess pattern is formed on the device separating film. The width of the second recess pattern is expanded while simultaneously eliminating the screen oxidation film. A first insulating layer is formed on the substrate having the second recess pattern with the expanded width.</p>
申请公布号 KR20100069101(A) 申请公布日期 2010.06.24
申请号 KR20080127682 申请日期 2008.12.16
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, HYUNG HWAN;CHAE, KWANG KEE;JUNG, JONG GOO;MOON, OK MIN;LEE, YOUNG BANG;PARK, SUNG EUN
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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