发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE: A manufacturing method of a semiconductor device is provided to prevent the generation of a SAC failure by preventing the generation of a bridge between a gate and a LPC plug. CONSTITUTION: A device separating film, which limits an active area(102), is formed. A screen oxidation film(120) is formed on the active area of a semiconductor substrate. The device separating film(110) part is etched and a first recess pattern is formed on the active area. A second recess pattern is formed on the device separating film. The width of the second recess pattern is expanded while simultaneously eliminating the screen oxidation film. A first insulating layer is formed on the substrate having the second recess pattern with the expanded width.</p> |
申请公布号 |
KR20100069101(A) |
申请公布日期 |
2010.06.24 |
申请号 |
KR20080127682 |
申请日期 |
2008.12.16 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, HYUNG HWAN;CHAE, KWANG KEE;JUNG, JONG GOO;MOON, OK MIN;LEE, YOUNG BANG;PARK, SUNG EUN |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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