发明名称 Apparatus And Method For The Detection Of Forces In The Sub-Micronewton Range
摘要 A force microscope for the detection of forces in the sub-micronewton range has a measurement head which is used to carry out a relative movement with respect to a sample holder and to which a carrier molecule is attached on which probe molecules are placed.
申请公布号 US2010011472(A1) 申请公布日期 2010.01.14
申请号 US20090497364 申请日期 2009.07.02
申请人 HUGEL THORSTEN;GEISLER MICHAEL 发明人 HUGEL THORSTEN;GEISLER MICHAEL
分类号 G01Q30/04;G01Q60/42 主分类号 G01Q30/04
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