发明名称 DUAL WORK FUNCTION SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 A method of manufacturing dual work function devices starting from a single metal electrode and the device resulting therefrom are disclosed. In one aspect, the method includes a single-metal-single-dielectric (SMSD) CMOS integration scheme. A single dielectric stack comprising a gate dielectric layer and a dielectric capping layer and one metal layer overlying the dielectric stack are first deposited, forming a metal-dielectric interface. Upon forming the dielectric stack and the metal layer, at least part of the dielectric capping layer is selectively modified by adding work function tuning elements, the part being adjacent to the metal-dielectric interface.
申请公布号 US2009134466(A1) 申请公布日期 2009.05.28
申请号 US20080258222 申请日期 2008.10.24
申请人 INTERUNIVERSITAIR MCROELEKTRONICA CENTRUM VZW(IMEC);TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.;SAMSUNG ELECTONICS CO. LTD. 发明人 CHO HAG-JU;CHANG SHIH-HSUN
分类号 H01L25/03;H01L21/4763 主分类号 H01L25/03
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