发明名称 |
ELECTRICAL TEST PROBE AND ELECTRICAL TEST PROBE ASSEMBLY |
摘要 |
<p>An electrical test probe and an electrical test probe assembly is provided to improve durability of a probe by preventing a defect or damage of a needle part of the probe. An electrical test probe(122) includes a needle part(122b) and a needle main body part. The needle main body part includes a pedestal part which is formed by protruding the needle part. The needle main body part is made of a metal material having toughness. The needle part is formed at the needle main body part. The needle part is composed of a stacked structure of a first metal material layer(140a) and a second metal material layer(140b). The first metal material layer has hardness higher than the hardness of the metal material of the needle main body part. The second metal material layer has the toughness higher than the toughness of the first metal material layer.</p> |
申请公布号 |
KR20090012275(A) |
申请公布日期 |
2009.02.02 |
申请号 |
KR20090000946 |
申请日期 |
2009.01.06 |
申请人 |
KABUSHIKI KAISHA NIHON MICRONICS |
发明人 |
HIRAKAWA HIDEKI;SOMA AKIRA;HAYASHIZAKI TAKAYUKI;KUNIYOSHI SHINJI |
分类号 |
G01R1/073 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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