发明名称 RESIST SEPARATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a resist separation method capable of satisfactorily separating a resist attached to a substrate on whose surface a low dielectric film (porous Low-k film) is formed from the substrate without damaging the porous low dielectric film. SOLUTION: A reinforcement treating fluid is prepared by mixing a reinforcement agent essentially including a silylation agent with SCCO2 and supplied to a treatment chamber. Accordingly, the porous Low-k film formed on the substrate W is silylated. A separation agent essentially including a fluoride component is then mixed with the SCCO2 to prepare a separation treating fluid, and the separation treating fluid is supplied to the treatment chamber. Because etching resistance to the separation agent of the porous Low-k film is enhanced by the silylation, the resist can be separated and removed without damaging the porous Low-k film. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009008774(A) 申请公布日期 2009.01.15
申请号 JP20070168418 申请日期 2007.06.27
申请人 DAINIPPON SCREEN MFG CO LTD 发明人 SAITO KIMITSUGU
分类号 G03F7/42;H01L21/027;H01L21/768;H01L23/522 主分类号 G03F7/42
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