发明名称 ION DOPING APPARATUS AND DOPING METHOD OF THE SAME
摘要 An ion doping apparatus and a method thereof are provided to prevent a doping defect by controlling a beam current of an ion beam and an ion amount in real time. An ion doping apparatus includes an ion source(100), a substrate fixing unit(200), a beam current correcting unit(300), a doping amount measuring unit(400), and an ion beam control unit(500). The ion source produces ion beam. The substrate fixing unit fixes a substrate to which an ion is doped. The beam current correcting unit corrects beam current by positions of the ion beam between the ion source and the substrate fixing unit. The doping amount measuring unit is positioned on the same plate as that of the substrate, and measures a doping amount of ion. The ion beam control unit is connected with the doping amount measuring unit, and controls the ion source and the beam current correcting unit according to the doping amount of the ion.
申请公布号 KR20080074293(A) 申请公布日期 2008.08.13
申请号 KR20070013111 申请日期 2007.02.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, DEOK HOI;YI, CHUNG
分类号 G02F1/13;G02F1/136 主分类号 G02F1/13
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