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发明名称
Testvorrichtung und Testverfahren für Mixed-Signal Halbleiterbauteile sowie elektrische Schaltung zur Erzeugung von Zahlenwerten zur Nachbildung eines sinusförmigen Signals
摘要
申请公布号
DE102005015311(B4)
申请公布日期
2008.06.12
申请号
DE200510015311
申请日期
2005.04.01
申请人
INFINEON TECHNOLOGIES AG
发明人
SATTLER, SEBASTIAN;MATTES, HEINZ
分类号
G01R31/3167
主分类号
G01R31/3167
代理机构
代理人
主权项
地址
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