POGO PIN AND CONTACTOR FOR TESTING SEMICONDUCTOR DEVICE COMPRISING THE SAME POGO PIN

摘要

A pogo pin and a contactor for testing a semiconductor device comprising the same are provided to prevent damage due to a contact between solder balls by forming a contact pad with a conductive rubber material. A contact pad part(120) is formed of a conductive rubber material. A spring(140) is formed at a lower portion of the contact pad part. A contact pad(122) is formed at an upper portion of the contact pad part. The contact pad is formed of conductive silicon rubber. A conductive plunger(124) is formed at the lower portion of the contact pad part. The contact pad includes metallic powders to be stored therein. The metallic powders are plated with gold. The conductive plunger and the spring are plated with the gold. The contact pad is a shape of cylindrical column. A diameter of a lower part of the metal plunger is larger than a diameter of an upper part of the metal plunger so that a part of the spring is inserted into the metal plunger.