发明名称 FABRICATION PROCESS OF SEMICONDUCTOR WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide a fabrication process of a semiconductor wafer, in which a nitride semiconductor film is formed on a substrate of a desired material other than a substrate for the epitaxial growth of a nitride semiconductor film. <P>SOLUTION: A first nitride semiconductor film 2 is formed on a first substrate 1 and a second nitride semiconductor film 3 having a higher melting point than that of the first film 2 is formed on the first nitride semiconductor film 2. Subsequently, a carrier substrate 4 is adhered to the surface of the second nitride film 3. Then, the substrate 1 attached together, the first nitride semiconductor film 2, the second nitride semiconductor film 3 and a wafer containing the carrier substrate 4 are heat treated at a temperature higher than the melting point of the first nitride semiconductor film 2 and lower than that of the second nitride semiconductor film 3, to melt the first nitride semiconductor film 2 and remove the first substrate 1. Further, the second substrate 6 is attached to the surface of the second nitride semiconductor film 3 which is attached on the carrier substrate 4, and the carrier substrate 4 is removed. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007332012(A) 申请公布日期 2007.12.27
申请号 JP20060169214 申请日期 2006.06.19
申请人 HITACHI CABLE LTD 发明人 TANAKA TAKESHI
分类号 C30B29/38;C23C16/01;C30B25/18;H01L21/31;H01L33/32;H01S5/323 主分类号 C30B29/38
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