发明名称 METHOD AND SYSTEM FOR PERFORMING PLASMA ENHANCED ATOMIC LAYER DEPOSITION
摘要 <p>A method, computer readable medium, and system for vapor deposition on a substrate that introduce a gaseous film precursor to a process space, increase the volume of the process space from a first size to a second size to form an enlarged process space, introduce a reduction gas to the enlarged process space, and form a reduction plasma from the reduction gas. The system for vapor deposition includes a process chamber including a first process space and further including a second process space that includes the first process space and that has a second volume that exceeds the first volume. The first process space is configured for atomic layer deposition, and the second process space is configured for plasma reduction of a layer deposited in the first process space.</p>
申请公布号 WO2007061633(A2) 申请公布日期 2007.05.31
申请号 WO2006US43545 申请日期 2006.11.09
申请人 FAGUET, JACQUES;TOKYO ELECTRON LIMITED 发明人 FAGUET, JACQUES
分类号 G06F19/00;C23C16/00;H05H1/24 主分类号 G06F19/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利