发明名称 CLEANING UNIT FOR IMAGING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a cleaning unit used in contact with the surface of an imaging element that can surely remove a foreign material. SOLUTION: A connection part 14 includes first and second connection members 16, 18 formed symmetrical around a center line of a main body part 20. The main body part 20 and the first connection member 16 are integrally formed. A force applied from the main body part 20 to the imaging element 32 when the cleaning unit 10 is moved in a direction as shown in the arrow A and a plane part 12, to which the foreign material is to be adhered, is in contact with the imaging element 32, is uniformly transmitted to the plane part 12 via the first and second connection members 16, 18. On the other hand, a force applied from the main body part 20 when the cleaning unit 10 is moved in a direction as shown in the arrow B and the plane part 12 is exfoliated from the imaging element 32, is transmitted to the plane part 12 via only the first connection member 16. Thus, the plane part 12 is depressed onto the surface 32S of the imaging element with the uniform force and gradually exfoliated from the surface 32S of the imaging element from a region at a side of a first long side 12U to a region of a side of a second long side 12D. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007110204(A) 申请公布日期 2007.04.26
申请号 JP20050296211 申请日期 2005.10.11
申请人 PENTAX CORP 发明人 FUNATSU KOJI
分类号 H04N5/225;G03B17/02;G03B17/56;H04N101/00 主分类号 H04N5/225
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