INTERNAL VOLTAGE TRIMMING TEST CIRCUIT, ESPECIALLY FOR OBTAINING DESIRED INTERNAL VOLTAGE LEVEL AND PREVENTING TEST ERROR,申请号KR20050089340-传众专利搜索

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发明名称	INTERNAL VOLTAGE TRIMMING TEST CIRCUIT, ESPECIALLY FOR OBTAINING DESIRED INTERNAL VOLTAGE LEVEL AND PREVENTING TEST ERROR
摘要
申请公布号	KR20070034786(A)	申请公布日期	2007.03.29
申请号	KR20050089340	申请日期	2005.09.26
申请人		发明人
分类号	G11C29/00	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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