发明名称 METHOD FOR GENERATION AN FINAL ALIGN MARK COORDINATES IN RETICLE FRAME GENERATION SOFTWARE
摘要 <p>A method for generating final align mark coordinates in a reticle frame generation software is provided to enable an engineer to obtain accurate data during setting up of a job file by preventing a layer mismatch in coordinate values inside a file containing the final align mark coordinates. An RFG(Reticle Frame Generator) software is executed in a workstation, which is used for manufacturing reticles(S100). The RFG software has various firmware, which is different from one another according to various semiconductor manufacturers. A reticle layout is obtained to define a scribe lane(S110). When a key cutting process is performed on the reticle layout to obtain final align mark coordinates(S120), the coordinates of the align mark are automatically extracted, and a common file is generated. Names of respective layers are compared with each other, such that layer mismatch is prevented(S130).</p>
申请公布号 KR20060117724(A) 申请公布日期 2006.11.17
申请号 KR20050040221 申请日期 2005.05.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JANG, WOO CHUL
分类号 H01L21/027 主分类号 H01L21/027
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