发明名称 Semiconductor memory and method of correcting errors for the same
摘要 A semiconductor memory employs the redundancy memory technique and the error correction code technique and method of correcting errors. The method of correcting errors reads data bits and a checking bit from a predetermined unit of a first memory array such as a main memory array, and the data bits are checked based on the checking bit to determine if there is any error. If there is an error in the data bits, the checking bit is used to correct the error and the data bits together with the checking bit are written back to the predetermined unit. If there is still error in the data bits after the read-check-write process is repeated a predetermined number of times, the predetermined unit is marked as a faulty unit and the data bits together with the checking bit are written to a second memory array such as a redundancy memory array.
申请公布号 US2006253723(A1) 申请公布日期 2006.11.09
申请号 US20050197657 申请日期 2005.08.04
申请人 NATIONAL TSING HUA UNIVERSITY 发明人 WU CHENG-WEN;SU CHIN-LUNG;YEH YI-TING
分类号 G11C7/10;G06F11/00 主分类号 G11C7/10
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