发明名称 Underfilled, encapsulated semiconductor die assemblies and methods of fabrication
摘要 An apparatus and method for packaging a semiconductor die and a carrier substrate to substantially prevent trapped moisture therebetween and provide a robust, inflexible cost-effective bond. The semiconductor die is attached to the carrier substrate with a plurality of discrete adhesive elements so as to provide a gap or standoff therebetween. Wire bonds may then be formed between bond pads on the semiconductor die to conductive pads or terminals on the carrier substrate. With this arrangement, a dielectric filler material is disposed in the gap or standoff to form a permanent bonding agent between the semiconductor die and the carrier substrate. By applying the dielectric filler material after forming the wire bonds, the dielectric filler material coats at least a portion of the wire bonds to stabilize the wire bonds and prevent wire sweep in an encapsulation process, such as transfer molding, performed thereafter.
申请公布号 US7116000(B2) 申请公布日期 2006.10.03
申请号 US20040785122 申请日期 2004.02.24
申请人 MICRON TECHNOLOGY, INC. 发明人 HALL FRANK L.;BAERLOCHER CARY J.
分类号 H01L23/48;H01L21/56;H01L23/31;H01L23/495 主分类号 H01L23/48
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