| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory testing device capable of preventing the degradation of defect detection capability by making it possible to test an aimed address or the address other than the aimed address without changing a test pattern and a pattern program. SOLUTION: The semiconductor memory testing device is composed of: a pattern generator which produces an address signal for testing, a data, and a control signal, and supplies them to a memory to be tested; an address detecting circuit which is provided with an address register for storing the aimed address therein, and judges whether or not the address signal outputted from the pattern generator agrees with the aimed address; a data comparator which compares a response output from the memory to be tested with an expected value generated by the pattern generator and thereby judges agreement/disagreement between them; and a data comparison control circuit which outputs a strobe signal to start/stop operating the data comparator according to a result of the judgment of the address detecting circuit. COPYRIGHT: (C)2006,JPO&NCIPI
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