发明名称 Integrated circuit`s semiconductor components testing system, has control unit that switches switching device based on power consumption information to connect or separate integrated circuits with or from supply unit
摘要 <p>The system has a supply unit (5) for providing supply to integrated circuits, and switching devices connecting the circuits with the unit. A control unit (8) controls the switching devices, and a determination unit determines information about power consumption of the circuits. The control unit switches the switching device based on the information, to connect the circuits with the unit (5) or to separate the circuits from the unit (5). An independent claim is also included for a method of configuring a test system.</p>
申请公布号 DE102005005101(A1) 申请公布日期 2006.08.17
申请号 DE20051005101 申请日期 2005.02.04
申请人 INFINEON TECHNOLOGIES AG 发明人 FRANKOWSKY, GERD
分类号 G01R31/28;H01L21/66 主分类号 G01R31/28
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