| 摘要 |
Integrated circuit (3) has terminal (F1) connected to two semiconductor contact studs (P1a, P1b) such that the geometrical and electrical characteristics between the doubly earthed terminal and two others are equal or nearly equal enabling earth continuity to be established by voltage comparison. Semiconductor (2) has contact studs (P) connected to terminals (F) by wires (W), and entirely encapsulated to form an integrated circuit (IC), of which one terminal (F1) is connected to two earth contact studs (P1a, P1b) such that normal continuity tests do not reveal failure of only one of the wires (W1a,W1b) due to action of substratum. The IC is manufactured such that the geometrical and electrical characteristics between the doubly earthed terminal (F1) and two other terminals (F2, F3) are equal or very nearly equal. Generators (9,10) apply currents to these two circuits and the terminal voltages are measured (11,12) and sequenced (13). The difference (14) between the two voltages is compared (15) with a threshold (16) to determine healthy conditions or otherwise. |
