| 摘要 |
PROBLEM TO BE SOLVED: To provide an electro-optic device and a test method thereof which enable defects of transistors to be precisely found even in a configuration where a power source voltage is made into one system for a logic circuit or the like and a buffer circuit or the like. SOLUTION: The electro-optic device is provided with: a shift register 141 and an output control circuit 143 which use a power source voltage (VddY-VssY) to generate logic signals Q<SB>1</SB>to Q<SB>360</SB>for selecting scan lines in a prescribed order; and a scan line selection circuit 145 which uses the logic signals Q<SB>1</SB>to Q<SB>360</SB>to make signals Ya<SB>-1</SB>to Ya<SB>-360</SB>before buffer in the case of a display mode and fixes the signals Ya<SB>-1</SB>to Ya<SB>-360</SB>to contents for setting all scan lines to an all selected state independently of the logic signals Q<SB>1</SB>to Q<SB>360</SB>. Since forcible selection of all scan lines not only actualizes the existence of defects which cannot be found unless the scan lines are selected in order but also dispenses with operations of the shift register 141 and the output control circuit 143, the proportion of a leak current to a power source current is improved, and as a result, the precision of judgment of the power source current and a threshold is improved. COPYRIGHT: (C)2006,JPO&NCIPI
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