发明名称 |
METHOD AND APPARATUS FOR INSPECTING TUNNEL MAGNETO-RESISTANCE EFFECT ELEMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and an apparatus for inspecting a TMR element by which the stability and the reliability of the TMR element can be quickly and surely checked without breaking the element. SOLUTION: An initial resistance value of the TMR element is measured as a first resistance value, a resistance value obtained after applying a voltage higher than a normally-used voltage to the TMR element is measured as a second resistance value, and the TMR element is evaluated in accordance with a change degree of the second resistance value from the first resistance value. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2005340430(A) |
申请公布日期 |
2005.12.08 |
申请号 |
JP20040156013 |
申请日期 |
2004.05.26 |
申请人 |
TDK CORP |
发明人 |
SARUGI SHUNJI;HACHISUGA NOZOMI;TAKAHASHI NORIO |
分类号 |
G01R33/09;G11B5/39;G11B5/455;H01L21/8246;H01L27/105;H01L43/08;(IPC1-7):H01L43/08 |
主分类号 |
G01R33/09 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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