发明名称 Mask blank manufacturing method, transfer mask manufacturing method, sputtering target for manufacturing mask blank
摘要 To provide a method for manufacturing a mask blank capable of manufacturing a high quality mask blank that suppresses generation of defects in a thin film for forming a mask pattern with high yields, a method for manufacturing a transfer mask that manufactures the thin film of the mask blank by patterning, and a sputtering target used for manufacturing the mask blank. By using the sputtering target containing silicon and having a hardness of 900 HV or more in Vickers' hardness, the thin film for forming the mask pattern on a substrate is formed by sputtering, and the high quality mask blank that suppresses generating of defects is manufactured, and further the transfer mask is manufactured by patterning the thin film.
申请公布号 US2005250017(A1) 申请公布日期 2005.11.10
申请号 US20030523470 申请日期 2003.08.19
申请人 HOYA CORPORATION 发明人 MITSUI MASARU
分类号 A61N5/00;C23C14/00;C23C14/06;C23C14/32;C23C14/34;G03F1/24;G03F1/32;G03F1/68;G03F9/00;G21G5/00;H01L21/027;(IPC1-7):C23C14/32 主分类号 A61N5/00
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