发明名称 |
Integrated circuit that can be externally tested through a normal signal output pin |
摘要 |
An integrated circuit can be tested externally at its normal signal output pin(s) without requiring additional testing output pins or test measuring pads. The integrated circuit includes a circuit unit that generates a normal output signal provided to the signal output pin in a normal operating mode and generates a test signal in a testing mode, a switching element that selectively does or does not connect the test signal from the circuit unit to the signal output pin, and a control unit that controls the switching element with a control signal responsive to the potential level present at the signal output pin. When the circuit is to be tested, a defined voltage is applied to the signal output pin by a voltage divider formed of resistors between a supply voltage and a reference voltage. This causes the control unit to close the switching element.
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申请公布号 |
US6937051(B2) |
申请公布日期 |
2005.08.30 |
申请号 |
US20040888627 |
申请日期 |
2004.07.08 |
申请人 |
VISHAY SEMICONDUCTOR GMBH |
发明人 |
EICHIN MATTHIAS;KURZ ALEXANDER |
分类号 |
G01R31/28;G01R31/3185;G11C29/46;G11C29/48;H01L21/822;H01L27/04;(IPC1-7):G01R31/26;G01R1/04 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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