发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To suppress plane channeling at the time of ion implantation without changing a crystal plane direction of a wafer itself. SOLUTION: At the time of ion implantation into the semiconductor wafer W1, a tilting angleθwith respect to a (100)-plane is set to 0°or above and a twisting angleδwith respect to the <011>-direction is set within a range of 45°±5°. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005166730(A) 申请公布日期 2005.06.23
申请号 JP20030400030 申请日期 2003.11.28
申请人 SEIKO EPSON CORP 发明人 UEDA YOSHITO
分类号 H01L21/265;(IPC1-7):H01L21/265 主分类号 H01L21/265
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