发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device with an interlayer insulating layer embedded well even in a miniturized semiconductor device. SOLUTION: A semiconductor device comprises: a semiconductor layer 10; a first interlayer insulating layer 20 formed at the upper part of the semiconductor layer 1; a wiring layer 30 formed at the upper part of the first interlayer insulating layer 20; and a second interlayer insulating layer 50 including a low dielectric constant layer 40 filled between the wiring layers 30. The low dielectric constant layer 40 comprises a plurality of layers having different contents of fluorine. COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005101597(A) |
申请公布日期 |
2005.04.14 |
申请号 |
JP20040258198 |
申请日期 |
2004.09.06 |
申请人 |
SEIKO EPSON CORP |
发明人 |
OOMI HIROSHI;MORI KATSUMI |
分类号 |
H01L23/522;H01L21/316;H01L21/768;(IPC1-7):H01L21/768 |
主分类号 |
H01L23/522 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|