| 摘要 |
The present invention is aimed at enabling a spin-transfer magnetization switching in the random access magnetic memory by reducing a switching current density in the spin-transfer magnetization switching to an order smaller than 10 MA/cm<2 >and without causing breakdowns neither in the memory element which uses a TMR film nor in the element selection FET. The memory layer in the magnetoresistance effect element comprises a magnetic film having a value of saturation magnetization in a range from 400 kA/m to 800 kA/m. The memory layer comprises a magnetic film which contains one or more magnetic elements selected from the group of, for example, cobalt, iron and nickel, and which further contains a non-magnetic element. The non-magnetic element is contained at a ratio of, for example, 5 at % or more and less than 50 at %. A memory layer 12 in the memory cell has a dimension less than 200 nmphi.
|
