发明名称 Strained silicon MOSFET having improved carrier mobility, strained silicon CMOS device, and methods of their formation
摘要 The mobility enhancement of a strained silicon layer is augmented through incorporation of carbon into a strained silicon lattice to which strain is also imparted by an underlying silicon germanium layer. The presence of the relatively small carbon atoms effectively increases the spacing within the strained silicon lattice and thus imparts additional strain. This enhancement may be implemented for any MOSFET device including silicon on insulator MOSFETs, and is preferably selectively implemented for the PMOS components of CMOS devices to achieve approximately equal carrier mobility for the PMOS and NMOS devices.
申请公布号 US6849527(B1) 申请公布日期 2005.02.01
申请号 US20030684727 申请日期 2003.10.14
申请人 ADVANCED MICRO DEVICES 发明人 XIANG QI
分类号 H01L21/265;H01L21/336;H01L21/8238;H01L29/10;(IPC1-7):H01L21/425 主分类号 H01L21/265
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