发明名称 Substrate processing apparatus and method for adjusting a substrate transfer position
摘要 A substrate processing apparatus can align a substrate with a high precision and a high speed by monitoring a mark formed on a surface of the substrate; operating an amount of misalignment between the center of the substrate and a rotation center of a substrate support member; determining a presence of the misalignment and adjusting the substrate such that the center of the substrate coincides with the rotation center of the substrate support member.
申请公布号 US2005016818(A1) 申请公布日期 2005.01.27
申请号 US20040859340 申请日期 2004.06.03
申请人 TOKYO ELECTRON LIMITED 发明人 ITO KAZUHIKO;ISHIMARU KAZUTOSHI;OOKURA JUN;KINOSHITA MICHIO;DOUKI YUICHI
分类号 H01L21/68;B05B12/12;B05B13/02;H01L21/00;(IPC1-7):H01L21/68 主分类号 H01L21/68
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