发明名称 Method for fabricating conductive line on a wafer
摘要 A method for fabricating an Al-Si-containing alloy line, which is adapted to form a conductive line on a substrate, is described. A first conductive layer, a second conductive layer and an Al-Si-containing alloy layer are sequentially formed on the substrate. Then, the substrate temperature is rapidly lowered to between about 0° C. and 25° C. in about 1 second to 10 seconds. A patterned photo-resist layer is formed on the third conductive layer. The patterned photo-resist layer is used as a mask, and the third conductive layer, the Al-Si-containing alloy layer, the second conductive layer and the first conductive layer are etched to form the conductive line.
申请公布号 US6825100(B2) 申请公布日期 2004.11.30
申请号 US20020079575 申请日期 2002.02.22
申请人 WINBOND ELECTRONICS CORPORATION 发明人 CHANG CHING-TSAI
分类号 H01L21/3205;H01L21/768;(IPC1-7):H01L21/322 主分类号 H01L21/3205
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