发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device having a shallow impurity region. SOLUTION: In the method for manufacturing a semiconductor device, a gate electrode part having a gate oxide film, a floating gate on the gate oxide film, a control gate on the floating gate, and an oxide formed by oxidizing the floating gate and the control gate is formed on a semiconductor. Impurities are then added to the semiconductor using the gate electrode part as a mask to form an impurity region having a depth of 0.1μm or less. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004297077(A) 申请公布日期 2004.10.21
申请号 JP20040138077 申请日期 2004.05.07
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;TAKEMURA YASUHIKO
分类号 H01L21/8238;H01L21/20;H01L21/8247;H01L27/092;H01L27/115;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L21/824;H01L21/823 主分类号 H01L21/8238
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