| 摘要 |
The invention comprises: a rest base (1) for a sample (2) to be examined, at least a first and a second optical systems (3, 4), identifying two optical paths located at a predetermined distance one from another. The at least a first and a second optical systems (3, 4) are commandable and are able to focus, with a predetermined enlargement, on two ends of the sample (2). The at least a first and a second optical systems (3, 4) are arranged and maintained on parallel planes which are also parallel to the rest base (1). The invention also comprises at least a monitoring and measuring device able to gather images sent by the at least a first and a second optical systems (3, 4). The apparatus is structured to carry out measurements of dimensions of a sample (2) while completely eliminating any influence on the measurements by the measuring system and the rest base for the sample.
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