发明名称 METHOD AND MICROSCOPE FOR DETECTING SUBJECT IMAGING
摘要 <P>PROBLEM TO BE SOLVED: To provide a microscope minimizing an error of the interpretation of measured values. <P>SOLUTION: A subject 2 is illuminated with a light source 3, imaged by an imaging system 4, preferably detector 5 embodied in a CCD (charge-coupled device) camera, the detected image of the subject 2 is compared with a reference image so as to minimize the error of interpretation of the measured value. Information about characteristics of the imaging system 4 is taken into consideration at the time of a generation of the reference image, a difference capable of being demarcated from the compared image is modified so as to be conformed with the reference image and the detected image in at least most part of them. <P>COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004191375(A) 申请公布日期 2004.07.08
申请号 JP20030405857 申请日期 2003.12.04
申请人 LEICA MICROSYSTEMS SEMICONDUCTOR GMBH 发明人 CEMIC FRANZ;BLAESING-BANGERT CAROLA
分类号 G01B11/00;G06T1/00;G06T7/00 主分类号 G01B11/00
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