发明名称 Heat processing apparatus
摘要 A heat processing apparatus comprises a hot plate for putting the substrate on or near its surface, a ceiling with a first and second concentric regions with a first and second heat pipes, respectively, opposite to the hot plate surface, a member surrounding a space between the hot plate and the ceiling, a gas flow generator supplying gas to the a region from a circumference of the hot plate to a center of the ceiling, and a temperature control mechanism for controlling a regional temperature of the first region in such a manner that a heat emission is greater from a center of the substrate than from a circumference of the substrate, thus heating a substrate to a uniform temperature all over its surface.
申请公布号 US6744020(B2) 申请公布日期 2004.06.01
申请号 US20010028789 申请日期 2001.12.28
申请人 TOKYO ELECTRON LIMITED 发明人 SHIRAKAWA EIICHI;FUKUOKA TETSUO;NOGAMI TSUYOSHI
分类号 H01L21/027;F27D19/00;F28D15/02;F28D15/06;H01L21/00;(IPC1-7):H05B1/02 主分类号 H01L21/027
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