PROBE SHEET FOR INSPECTING FLAT DISPLAY DEVICE, METHOD FOR MANUFACTURING THE SAME AND PROBE ASSEMBLY PROVIDED WITH THE SAME

摘要

PURPOSE: A probe sheet for inspecting a flat display device, a method manufacturing the same and a probe assembly provided with the same are provided to positively cope with a current fine pitch in a highly integrated flat display device. CONSTITUTION: A probe sheet for inspecting a flat display device includes an inspecting tip and a plurality of unit contact member(30). Each of the unit contact member(30) is provided with a beam unit(20) in the form of bar shape, a contact tip(24a) and a connection tip(24b). The beam unit(20) is integrated at one side of the inspection tip below a predetermined thin film(22).