发明名称 SEMICONDUCTOR MANUFACTURING EQUIPMENT HAVING APPARATUS FOR SENSING TEACHING STATUS OF WAFER ROTATION AND ITS METHOD
摘要 PURPOSE: Semiconductor manufacturing equipment having an apparatus for sensing the teaching status of wafer and its method are provided to be capable of checking the teaching state of a flat zone wafer at any time under a predetermined process. CONSTITUTION: A semiconductor manufacturing equipment includes a space change unit(120) having a sensing device for wafer's teaching status which senses whether a flat zone wafer(10) is rotated, or not. The sensing device for wafer's teaching status includes a light emitting and receiving sensor support part(210) spaced apart from each other, a light emitting sensor part installed at the light emitting sensor support part, and a light receiving sensor part installed at the light receiving sensor support part. The sensing device for wafer's teaching status further includes an output part(230) for displaying whether the light transmitted from the light emitting sensor part is detected by the light receiving sensor part, or not.
申请公布号 KR20040041786(A) 申请公布日期 2004.05.20
申请号 KR20020069663 申请日期 2002.11.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, HO GYEONG
分类号 H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/68
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