| 摘要 |
PROBLEM TO BE SOLVED: To produce a large amount of fixed test data without increasing capacity of a test data storage region. SOLUTION: A base frame part 2 stores either arbitrary test data having an arbitrary pattern or one of base frame data to be processed to produce a large amount of fixed test data in accordance with a test data output mode. An ID counter 31 of a variable data part 3 is set with a count value and sequentially counts up. A commutation register 32 stores data inserting position information and inserting data. A data inserting part 4 outputs the arbitrary test data from the base frame part in an arbitrary data output mode, exchanges predetermined bits in the base frame data from the base frame part with the ID counter value in a fixed pattern output mode, exchanges bits in the base frame data designated by the data inserting position information from the commutation register with the inserting data and outputs the result as fixed test data. COPYRIGHT: (C)2004,JPO
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