发明名称 Self-aligned fabrication method for a semiconductor device
摘要 One embodiment of the present invention provides a method of fabricating a semiconductor device including the steps of forming a first semiconductor layer; forming a second semiconductor layer over the first semiconductor layer; forming a mask over a first portion the second semiconductor layer; removing a second portion of the second semiconductor layer not covered by the mask; forming a first electrical connector on the first semiconductor layer; and forming a second electrical connector on the first portion of the second semiconductor layer.
申请公布号 US6645819(B2) 申请公布日期 2003.11.11
申请号 US20010033099 申请日期 2001.10.19
申请人 GTRAN, INC. 发明人 PULLELA RAJASHEKHAR
分类号 H01L21/331;(IPC1-7):H01L21/822 主分类号 H01L21/331
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