TEST CIRCUIT FOR SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a test circuit for semiconductor device capable of fixing the logic of all input terminals by input from few terminals. SOLUTION: The gates of transistors 1 and 2 having the diode function of a protective transistor part 3 of the input terminals 7 are connected to control wirings 5 and 6. The control wirings 5 and 6 can be fixed to H or L by the input from the I/O output control terminal 15 and the test control terminals 9 and 16. Thus, all the input terminals can be simultaneously logically fixed by three input signals.