发明名称 METHOD FOR CLEAVING SEMICONDUCTOR WAFER AND SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a method for cleaving a semiconductor wafer and a semiconductor wafer, which readily enables the formation of an orientation flat by cleavage, and reduces the fracture of wafer, which occurs in a manufacturing process, by suppressing the strength degradation of the wafer. SOLUTION: A notched groove is formed on the rim of the semiconductor wafer so as to have a depth not piercing through the wafer. Cleavage is started from the notched groove.
申请公布号 JP2003100575(A) 申请公布日期 2003.04.04
申请号 JP20010294498 申请日期 2001.09.26
申请人 NIKKO MATERIALS CO LTD 发明人 KURITA HIDEKI;SUZUKI KENJI
分类号 H01S5/02;H01L21/02;(IPC1-7):H01L21/02 主分类号 H01S5/02
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