发明名称 Semiconductor storage device
摘要 A semiconductor memory device is provided which operates according to the specification of an SRAM, and which is capable of making the memory cycle shorter than heretofore, without normal access being delayed by the influence of refresh. An ATD circuit (4) receives change of an address ("Address"), and generates a one shot pulse in an address transition detect signal (ATD) after an address skew period has elapsed. In the case of a write request, a write enable signal (/WE) is dropped within the address skew period. First, writing or reading is performed from the rising edge of the one shot pulse, and, in the case of writing, late writing is performed using the address and the data which were presented at the time of the directly preceding write request. Next, refresh is performed during the period from the falling edge of the one shot pulse until the address skew period of the subsequent memory cycle is completed. And, for late writing at the time of the next write request, the address and the data are taken into register circuits (3, 12) upon the rising edge of the write enable signal (/WE).
申请公布号 US2003063512(A1) 申请公布日期 2003.04.03
申请号 US20020257193 申请日期 2002.10.09
申请人 TAKAHASHI HIROYUKI;INABA HIDEO;NAKAGAWA ATSUSHI 发明人 TAKAHASHI HIROYUKI;INABA HIDEO;NAKAGAWA ATSUSHI
分类号 G11C11/403;G11C7/10;G11C11/401;G11C11/406;G11C11/407;G11C11/408;(IPC1-7):G11C5/00;G11C7/00 主分类号 G11C11/403
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