发明名称 TREATING DEVICE AND CLEANING METHOD THEREFOR
摘要 After an SiOC:H film is formed, the cleaning of the interior of a chamber (11) starts. NF<sb>3</sb> and O<sb>2</sb> fed from an NF<sb>3</sb> source (S1) and an O<sb>2</sb> source (S2) are turned into plasma inside an activator (12) on a cleaning gas line (L1), and radicals in the plasma is selectively fed into the chamber (11). Fluorine and oxygen radicals in the cleaning gas remove an Si−containing matter and a C−containing matter deposited to the interior of the chamber (11).
申请公布号 WO03014413(A1) 申请公布日期 2003.02.20
申请号 WO2002JP08089 申请日期 2002.08.07
申请人 TOKYO ELECTRON LIMITED;KAWAMURA, KOHEI;MIYOSHI, HIDENORI;CHUNG, GISHI;OSHIMA, YASUHIRO;TAKAHASHI, HIROYUKI 发明人 KAWAMURA, KOHEI;MIYOSHI, HIDENORI;CHUNG, GISHI;OSHIMA, YASUHIRO;TAKAHASHI, HIROYUKI
分类号 H01J37/32;(IPC1-7):C23C16/44;H01L21/31;B01J19/08;B08B5/00;H05H1/46 主分类号 H01J37/32
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