After an SiOC:H film is formed, the cleaning of the interior of a chamber (11) starts. NF<sb>3</sb> and O<sb>2</sb> fed from an NF<sb>3</sb> source (S1) and an O<sb>2</sb> source (S2) are turned into plasma inside an activator (12) on a cleaning gas line (L1), and radicals in the plasma is selectively fed into the chamber (11). Fluorine and oxygen radicals in the cleaning gas remove an Si−containing matter and a C−containing matter deposited to the interior of the chamber (11).
申请公布号
WO03014413(A1)
申请公布日期
2003.02.20
申请号
WO2002JP08089
申请日期
2002.08.07
申请人
TOKYO ELECTRON LIMITED;KAWAMURA, KOHEI;MIYOSHI, HIDENORI;CHUNG, GISHI;OSHIMA, YASUHIRO;TAKAHASHI, HIROYUKI