SEMICONDUCTOR INTEGRATED CIRCUIT INCORPORATING THEREIN LOCAL MONITOR CIRCUITS

摘要

PURPOSE: A semiconductor integrated circuit incorporating therein a plurality of local monitor circuits is provided to easily and rapidly measure a change of on-chip process with respect to an operation speed. CONSTITUTION: A semiconductor integrated circuit(100) includes a boundary scan register(120) and a plurality of local monitor circuits(160). Each of the local monitor circuits(160) is individually assigned to a peripheral of the boundary scan register(120) and the semiconductor integrated circuit(100) in order to measure and predict an operation speed of the semiconductor integrated circuit(100) according to the change of on-chip process in a number of various local regions of the semiconductor integrated circuit(100). The operation speed of the semiconductor integrated circuit(100) is determined in consideration of a general signal delay time measured through the boundary scan register(120) and a correlation of local signal delay times respectively measured through the local monitor circuits(160).