发明名称 STRUCTURE OF BONDING PAD OF SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 <p>PURPOSE: A structure of a bonding pad of a semiconductor device and a method for fabricating the same are provided to prevent an escaping phenomenon from a lower film by improving a structure of a bonding pad. CONSTITUTION: An insulating layer(100) is formed on a conductive layer of a semiconductor substrate. An auxiliary layer(110) is formed on the insulating layer(100). A groove(111) is formed on the auxiliary layer(110). An insulating layer pattern(120) is formed on the auxiliary layer(110). A bonding pad(130) is formed by a conductive film. The bonding pad(130) is formed on the insulating layer pattern(120). A contact hole of the insulating layer pattern(120) and the groove(111) of the auxiliary layer(110) are filled by the bonding pad(130). Edge parts of the bonding pad(130) are supported by the insulating layer pattern(120). A protective layer(140) is formed on the insulating layer pattern(120) and the bonding pad(130).</p>
申请公布号 KR20020058235(A) 申请公布日期 2002.07.12
申请号 KR20000086274 申请日期 2000.12.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, GYU CHEOL;KIM, HONG GYUN;KIM, JAE UNG
分类号 H01L21/60;(IPC1-7):H01L21/60 主分类号 H01L21/60
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