发明名称 Method for fabricating a ferroelectric or paraelectric metal oxide-containing layer and a memory component therefrom
摘要 A method is described in which a metal oxide-containing layer is applied to a substrate and is then exposed to implantation with oxygen ions. A subsequent heat-treatment step can be carried out in an inert atmosphere and with shorter process times, since the oxygen is already present in the metal oxide-containing layer and, moreover, shorter diffusion paths are required for the oxygen to become intercalated in the crystal lattice of the metal oxide-containing layer. Therefore, adjacent layers, such as barrier layers, are less affected by the heat treatment.
申请公布号 US2002061604(A1) 申请公布日期 2002.05.23
申请号 US20010012166 申请日期 2001.10.26
申请人 SITARAM ARKALGUD;DEHM CHRISTINE 发明人 SITARAM ARKALGUD;DEHM CHRISTINE
分类号 H01L21/02;H01L21/314;H01L21/316;(IPC1-7):H01L21/00;H01L21/824 主分类号 H01L21/02
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